MAHR MarSurf VD 280 Roughness and Contour Measuring Station

MarSurf VD Series – The MarSurf family is complemented:

The easy change between roughness and contour tracing system

Depending on the measuring task, either the BFW roughness probe system for surface roughness or the C 11 contour probe system for contour measurements can be changed by the operator (hot-plug capable). The new system offers the advantages of combining the highly dynamic C 11 contour probe system with the high-precision BFW probe system, which is particularly suitable for fine surfaces.

The new measuring station concept combines speed, reliability and flexibility.

The aim is to increase the profitability of the system for your company.

The measuring stations are operated with the user-friendly MarWin software (MarWin Easy Roughness & Contour or MarWin Professional Roughness & Contour).

Ask a question

Description Iespējas Specification Video

MarSurf VD 280 Roughness and Contour Measuring Station

Innovative technologies:

Fast axes

Positioning speeds up to 200 mm/s in X
Contour measurements are 25 x faster than with its predecessor MarSurf PCV or MarSurf CD 120
Surface measurements are 40 x faster than with the MarSurf GD 120
By default, the Z-axis is fully CNC-capable
The Z-axis is approx. twice as fast as previous Mahr Z-axes
Up to 5 times faster than standard Z-axes on the market

Two reference probe systems for your measuring tasks

Contour probe system C 11

Probe arm recognition via integrated chip
Standard measuring range up to 70 mm; Max. 100 mm with 490 mm probe arm length
Magnetic probe arm holder, probe arm change without tools
The touch probe combines robustness with dynamics
Optional: Possibility to extend the roughness value determination to contours

Roughness probe system BFW

Easy probe arm change and probe arm protection by means of magnetic probe arm holder
Probe arm mount allows the change from standard to transverse measurement without tools or adapter
Extensions for the probe system possible

Innovative workpiece clamping system

Mounting plate 390 x 430 mm with hole dimension 50 mm
Integrated 60 mm TY adjustment
The combination of mounting plate and integrated TY adjustment makes an additional XY table superfluous
Low workpiece setup supports a favorable short measurement loop, which has a positive effect on the measurement results

	MarSurf VD 280	MarSurf VD 140
Start of traversing length (in X)	0 mm	0 mm
End of traversing length (in X)	280 mm	140 mm
Positioning speed	0.02 – 200 mm/s (in X)	0.02 – 200 mm/s (in X)
Guide deviation	0.07 µm / 20 mm (with probe system BFW 250) 0.35 µm / 60 mm 0.4 µm / 140 mm	0.07 µm / 20 mm (with probe system BFW 250) 0.35 µm / 60 mm 0.4 µm / 140 mm
Measuring speed	Up to 10 mm/s	Up to 10 mm/s
Measuring range mm	with probe system BFW 250 500 µm (±250 µm) for probe arm length 45 mm 1500 µm (±750 µm) for probe arm length 135 mmwith probe system C 11 70 mm with probe arm length 350 mm max. 100 mm with probe arm length 490 mm	with probe system BFW 250 500 µm (±250 µm) for probe arm length 45 mm 1500 µm (±750 µm) for probe arm length 135 mmwith probe system C 11 70 mm with probe arm length 350 mm max. 100 mm with probe arm length 490 mm