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Helmut-Fischer FISCHERSCOPE® X-RAY XDV®-SDD

Helmut-Fischer FISCHERSCOPE® X-RAY XDV®-SDD
Helmut-Fischer FISCHERSCOPE® X-RAY XDV®-SDD

Helmut-Fischer FISCHERSCOPE® X-RAY XDV®-SDD

Powerful XRF measuring device for universal use in the inspection of very thin or complex layers and performing RoHS screening at very low detection limits.

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Description Features Applications

X-ray fluorescence analysis for universally highest demands.

The FISCHERSCOPE® X-RAY XDV®-SDD is one of the most powerful X-ray fluorescence instruments in the Fischer portfolio. Take your measurement performance to a new level with this premium model. In combination with our in-house developed digital pulse processor DPP+, even higher count rates can now be processed, resulting in reduced measuring times or improved repeatability of your measurement results.

  • Built to last. 

Robust design for particularly high requirements

  • Fully automatable.

Let your device work for you with just one click

  • Quick-measure design.

With a few simple steps, the sample is placed and ready for measurement. Automated measurements of many parts are possible

  • Fast.

Thanks to short measuring times, you save valuable time

  • RoHS analysis.

Determination of pollutants with high detection accuracy and outstanding performance

  • DPP+ digital pulse processor.

Shorter measuring times or improvement of standard deviation*
*compared to the DPP

  • Microfocus tube with tungsten anode
  • Silicon drift detector 50 mm² with extra-large effective area of 50 mm²
  • Determination of metal content in electroplating baths with corresponding accessories
  • Measuring spot approx.: Ø 0.25 mm
  • Higher count rates and significantly reduced measurement times thanks to DPP+
  • Type approved full protection device
  • Up to 140 mm possible height of samples
  • 4-fold changeable apertures and 6-fold changeable filters
  • Measuring functional coatings in the electronics and semiconductor industry, e.g. determining the thickness of gold coatings down to 2 nm
  • Analysis of thin and very thin coatings in the electronics and semiconductor industry, such as gold/palladium layers of ≤ 0.1 μm
  • Determination of complex multilayer systems
  • Coating thickness measurement for photovoltaics, fuel cell and battery cell applications
  • Trace analyses of hazardous substances such as lead and cadmium according to RoHS, WEEE, CPSIA and other directives for electronics, packaging and consumer products
  • Analysis and authenticity check of gold and other precious metals and precious metal alloys
  • Direct determination of phosphorus content in functional NiP layers
  • Determination of the metal content of electroplating baths