Helmut-Fischer FISCHERSCOPE® X-RAY XDAL®

X-ray fluorescence analysis for higher demands.

Thin, thinner, XDAL®: Thanks to its microfocus tube and various semiconductor detectors, the FISCHERSCOPE® X-RAY XDAL® series is ideal for applications in the field of thin and very thin coatings < 0.05 μm as well as for material analysis in the ppm range. The instrument version with the 50 mm² silicon drift detector is furthermore suitable for RoHS measuring. The flexible and thanks to various configuration options (table, aperture, filter and detector), universal XDAL® measures reliably, precisely and stands for 100 % safety.

• Commissioning.

Extremely fast and simple

• One device, many possibilities.

Coating thickness measurement, material analysis and trace analysis

• Testing of multiple measuring points.

Even with large samples, measuring points are possible on the entire sample surface

• Also for large samples.

Hood with C-slot

• Fully automatable.

Let your instrument work for you with just one click

• Compact design.

Very good compromise between performance and space requirements