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Helmut-Fischer FISCHERSCOPE® X-RAY XDAL® 600

Helmut-Fischer FISCHERSCOPE® X-RAY XDAL® 600
Helmut-Fischer FISCHERSCOPE® X-RAY XDAL® 600

Helmut-Fischer FISCHERSCOPE® X-RAY XDAL® 600

Universal XRF instruments for measuring on the smallest structures, very thin multilayer coatings, functional coatings and very thin coatings ≤ 0.1 µm.

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Description Features Applications

Universal X-ray fluorescence analysis for very thin layers.

The FISCHERSCOPE® X-RAY XDAL® 600 is the universal XRF analyzer from Fischer for the determination of thin layers, trace elements and alloys. With top-down measurement, the sample is simply placed on the manually operated shear table. A laser pointer serves as a positioning aid. This means that even samples with complex geometries can be analyzed precisely and easily.

  • Versatile.

Ideal for electronics and semiconductor industry

  • RoHS analysis.

Reliable determination of hazardous substances

  • Quick-measure design.

The sample is placed and ready for measurement in just a few steps

  • Balanced.

Optimal cost-benefit ratio

  • DPP+ digital pulse processor.

Shorter measuring times or improvement of standard deviation*
*compared to the DPP

  • Silicon drift detector with extra-large effective area of 20 mm²
  • 4-fold changeable apertures and 3-fold changeable filters
  • Higher count rates and significantly reduced measurement times thanks to DPP+
  • Microfocus tube with tungsten anode
  • Up to 140 mm possible height of samples
  • Measuring spot approx.: Ø 0.15 mm
  • Analysis of thin and very thin coatings of ≤ 0.1 µm
  • Measuring functional coatings in the electronics and semiconductor industry, such as on lead frames, plug contacts or PCBs
  • Determination of complex multilayer systems
  • Determination of lead content in solders
  • Determination of phosphorus content in NiP coatings