MAHR MarSurf XR 1 Roughness measuring station

MAHR MarSurf XR 1 Roughness measuring station

MarSurf XR 1.  The ideal instrument for a low-cost introduction to user-friendly surface metrology.

The PC-based instrument delivers all common surface parameters and profiles in accordance with international standards, both in the measuring room and in production. MarSurf XR 1 from Mahr stands for innovative roughness evaluation software.

MarSurf XR 1 Roughness measuring station

 

  • Over 80 surface parameters for R-, P- and W-profiles according to current ISO/JIS or MOTIF standards (ISO 12085)
  • Bandpass filter Ls in accordance with current standard; Ls can also be switched off or varied as required
  • Comprehensive measuring records
  • Teach-in methods for the rapid creation of Quick&Easy measuring programs
  • Automatic functions for choosing cut-off and traversing length in accordance with standards
  • Support for various calibration methods (static and dynamic) by specifying the Ra or Rz parameter
  • Adjustable maintenance and calibration intervals
  • Multiple measuring station configurations for custom applications
  • Range of options provide system flexibility
  • Various user levels protect the device against misuse and prevent unauthorized people from using it
 

Measuring principle

Stylus method

Probe

BFW skidless system with MarSurf SD 26 drive unit and/or PHT skidded system with MarSurf RD 18 drive unit

Measuring range mm

+/- 250 µm (up to +/- 750 µm with 3x probe arm length) applies to BFW system

350 µm applies to PHT probe system

Filter according to ISO/JIS

filter as per ISO 16610-21(replaced Gaussian filter as per ISO 11562), robust Gaussian filter a per ISO 16610-31

Traversing lengths

MarSurf GD 26 / SD 26: Automatic; 0.56 mm*; 1.75 mm; 5.6 mm; 17.5 mm, 56 mm,

Measurement up to stop, variable

* Traversing length dependent on  drive unit

RD 18: Automatic; 1.75 mm; 5.6 mm; 17.5 mm

Number n of sampling length according to ISO/JIS

1 to 50 (default: 5)

Stylus

2 µm

Measuring force (N)

0.75 mN

Surface parameters

Over 80 surface parameters for R, P and W profiles according to current ISO/JIS or MOTIF standards (ISO 12085)