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MAHR MarSurf XC 2 mit CD 120 Contour measuring station

Your entry into precision contour measurement

The quick, simple and inexpensive 2D contour measuring system satisfies all demands in terms of accuracy and range of evaluation criteria

Pparameters that are dependent on datum elements are recalculated as soon as a datum element is changed

Outstanding calibration processes including geometry calibration, measuring force calibration, bend compensation, etc.

Automatic lowering and raising of the probe arm at individually adjustable speeds

Description

Technical data

	9999340 - MESSPLATZ XC 2 MarWin MarSurf	9036396 - Messplatz MarSurf XC 2 mit ST 500 ohne PC
Resolution	In Z, relative to stylus tip: 0.38 µm (350 mm probe arm) / 0.19 µm (175 mm probe arm) In Z, relative to measuring system: 0.04 µm	In Z, relative to stylus tip: 0.38 µm (350 mm probe arm) / 0.19 µm (175 mm probe arm) In Z, relative to measuring system: 0.04 µm
Sampling angle	On smooth surfaces, depending on deflection: trailing edges up to 88°, leading edges up to 77°	On smooth surfaces, depending on deflection: trailing edges up to 88°, leading edges up to 77°
Start of traversing length (in X)	0.2 mm	0.2 mm
Tip radius	25 µm	25 µm
Contacting speed (in Z)	0.1 to 1 mm/s	0.1 to 1 mm/s
Probe arm length	175 mm, 350 mm	175 mm, 350 mm
End of traversing length (in X)	120 mm	120 mm
Positioning speed	In X and return speed: 0.2 to 8 mm/s In Z: 0.2 to 10 mm/s	In X and return speed: 0.2 to 8 mm/s In Z: 0.2 to 10 mm/s
Guide deviation	< 1 µm (over 120 mm)	< 1 µm (over 120 mm)
Measuring speed	0.2 mm/s to 4 mm/s	0.2 mm/s to 4 mm/s
Measuring range mm	(in Z) 50 mm	(in Z) 50 mm
Traversing lengths	0.2 mm to 120 mm	0.2 mm to 120 mm
Measuring force (N)	1 mN to 120 mN	1 mN to 120 mN

9999340 - MESSPLATZ XC 2 MarWin MarSurf

9036396 - Messplatz MarSurf XC 2 mit ST 500 ohne PC

Resolution

In Z, relative to stylus tip: 0.38 µm (350 mm probe arm) / 0.19 µm (175 mm probe arm)

In Z, relative to measuring system: 0.04 µm

In Z, relative to stylus tip: 0.38 µm (350 mm probe arm) / 0.19 µm (175 mm probe arm)

In Z, relative to measuring system: 0.04 µm

Sampling angle

On smooth surfaces, depending on deflection: trailing edges up to 88°, leading edges up to 77°

Start of traversing length (in X)

0.2 mm

Tip radius