MarSurf VD Series - The MarSurf family is complemented:
The easy change between roughness and contour tracing system
Depending on the measuring task, either the BFW roughness probe system for surface roughness or the C 11 contour probe system for contour measurements can be changed by the operator (hot-plug capable). The new system offers the advantages of combining the highly dynamic C 11 contour probe system with the high-precision BFW probe system, which is particularly suitable for fine surfaces.The new measuring station concept combines speed, reliability and flexibility.The aim is to increase the profitability of the system for your company.The measuring stations are operated with the user-friendly MarWin software (MarWin Easy Roughness & Contour or MarWin Professional Roughness & Contour).Innovative technologies:
MarSurf VD 280 | MarSurf VD 140 | |
Start of traversing length (in X) | 0 mm | 0 mm |
End of traversing length (in X) | 280 mm | 140 mm |
Positioning speed | 0.02 - 200 mm/s (in X) | 0.02 - 200 mm/s (in X) |
Guide deviation | 0.07 µm / 20 mm (with probe system BFW 250)0.35 µm / 60 mm0.4 µm / 140 mm | 0.07 µm / 20 mm (with probe system BFW 250)0.35 µm / 60 mm0.4 µm / 140 mm |
Measuring speed | Up to 10 mm/s | Up to 10 mm/s |
Measuring range mm | with probe system BFW 250500 µm (±250 µm) for probe arm length 45 mm1500 µm (±750 µm) for probe arm length 135 mmwith probe system C 1170 mm with probe arm length 350 mmmax. 100 mm with probe arm length 490 mm | with probe system BFW 250500 µm (±250 µm) for probe arm length 45 mm1500 µm (±750 µm) for probe arm length 135 mmwith probe system C 1170 mm with probe arm length 350 mmmax. 100 mm with probe arm length 490 mm |