MAHR MarSurf CD 280 Contour Measuring Station, CD series

MAHR MarSurf CD 280 Contour Measuring Station, CD series

Contour measuring in a new dimension

The new MarSurf CD series from Mahr sets new standards when it comes to contour testing. With the new MarSurf CD series, manufacturing companies are entering a new dimension in order to reliably secure and improve the manufacturing quality of workpieces in the measuring room or close to production.

The new measuring station concept combines speed, reliability and flexibility. The aim is to increase the profitability of the system for your company.

MarSurf CD 280 Contour Measuring Station

Innovative technologies:

             Fast axes

  • Positioning speeds up to 200 mm/s in X
  • 25x faster than the predecessors MarSurf PCV and MarSurf CD 120
  • All measuring stations of this series have a fully CNC-capable Z-axis
  • The Z-axis is approx. twice as fast as previous Mahr Z-axes
  • Up to 5x faster than the X-axes usually found on the market

           Highly dynamic, intelligent probe system

  • Probe arm recognition via integrated chip
  • Standard measuring range up to 70 mm; max. 100 mm with 490 mm probe arms
  • Magnetic probe arm mount, probe arm change without tools
  • The probe system combines robustness with dynamics
  • Optional: Expansion for roughness evaluation

             Innovative workpiece clamping system

  • Mounting plate 390 x 430 mm with bore size 50 mm
  • Integrated 60 mm TY adjustment
  • The combination of mounting plate and integrated TY adjustment omits the needs for an additional XY table
  • Low workpiece set-up leads to an advantageously short measuring circuit, which positively affects the measuring results

MarSurf CD 280

MarSurf CD 140

Resolution

max. 6 nm (with 210 mm probe arm)

max. 6 nm (with 210 mm probe arm)

Start of traversing length (in X)

0.1 mm

0.1 mm

Probe arm length

210 mm; 350 mm; 490 mm

210 mm; 350 mm; 490 mm

End of traversing length (in X)

280 mm

140 mm

Positioning speed

0.02 - 200 mm/s (in X)

0.02 - 200 mm/s (in X)

Guide deviation

0,35  µm  /   60 mm

0,4     µm / 140 mm

0,75     µm / 280 mm

0.35 µm / 60 mm

0.4 µm / 140 mm

Measuring speed

0.02 - 10 mm/s

0.02 - 10 mm/s

Measuring range mm

70 mm (in Z with 350 mm probe arm)

max. 100 mm (with 490 mm probe arm)

70 mm (in Z with 350 mm probe arm)

max. 100 mm (with 490 mm probe arm)

Measuring force (N)

4 mN to 30 mN, in Z+ and Z-, adjustable via software

4 mN to 30 mN, in Z+ and Z-, adjustable via software