Helmut-Fischer , FISCHERSCOPE XDV-µ Series, XRF on Micro Structures

FISCHERSCOPE XDV-µ Series

XRF on Micro Structures

 

The models of the XDV® series are the most powerful X-ray fluorescence instruments in the Fischer portfolio. They are equipped with a highly sensitive silicon drift detector (SDD) and can further be fitted with different apertures and filters. Additionally, XDV-µ instruments come with a micro-focus tube. This makes them ideal for very demanding measurement tasks. Using XDV devices you can, for instance, analyze the thickness and elemental composition of coatings just 5 nm thick and test structures of just 10 µm.

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• Precise measurement of the thinnest coatings with repeatable accuracy, thanks to high-performance X-ray tubes and sensitive silicon drift detectors (SDD)
• Extremely robust construction for long-lasting serial testing, with outstanding long-term stability
• The XDV-µ LD option with a long measuring distance (min. 12 mm)
• An additional helium purge with the XDV-µ LEAD FRAME option provides for a very wide range of elements – from sodium (11) to uranium (92)
• Advanced polycapillary X-ray optics to focus the X-rays on an extremely small measurement surface
• Automated serial testing with programmable XY-table and Z-axis (optional)
• Fast and simple positioning of the probes with the help of video imaging and laser pointer