Helmut-Fischer FISCHERSCOPE X-RAY XDL and XDLM Series, XRF

FISCHERSCOPE X-RAY XDL and XDLM Series

Coating Thickness Measurement

 

With motor-driven axes (optional) and measurement direction from top to bottom, the measurement instruments from the XDL® range enable automated serial tests. A variety of versions – differing in their X-ray source, filter, aperture and detector – make it possible to select the X-ray device with the configuration that best suits your specific measurement task.

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• X-ray fluorescence instruments for a variety of measurement tasks, made possible through different hardware components
• Also suitable for testing assembled circuit boards or parts with indentations, due to the variable measuring distance (up to 80 mm)
• Automated serial testing with programmable XY-table and Z-axis (optional)
• Ideal for the measurement of very thin layers using the silicon drift detector with high energy resolution (XDAL device)