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Helmut-Fischer FISCHERSCOPE X-RAY 5000, XRF for Inline measurements
Helmut-Fischer FISCHERSCOPE X-RAY 5000, XRF for Inline measurements
Helmut-Fischer FISCHERSCOPE X-RAY 5000, XRF for Inline measurements
X-ray fluorescence instrument as modular unit for integration in manufacturing plants, for example on a traversing beam. Ideally suited for the measurement of thin layers on large surfaces.
The FISCHERSCOPE X-RAY 5000 can be integrated into manufacturing lines as a modular unit. Ideally suited for the inline measurement of thin layers on large surfaces.
Continuous measurement during ongoing processes, with connection to production systems
Flexible application: for vacuum or air, on surfaces up to 400°C
Particularly robust design and construction for sustainably precise measurements under harsh conditions
Outstandingly well-suited to coating thickness measurement and material analysis on products with large surfaces
